"Reliability and Variability of Advanced CMOS Devices at Cryogenic ..."

Alexander Grill et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128316

access: closed

type: Conference or Workshop Paper

metadata version: 2021-12-24

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Alexander Grill, Erik Bury, Jakob Michl, Stanislav Tyaginov, Dimitri Linten, Tibor Grasser, Bertrand Parvais, Ben Kaczer, Michael Waltl, Iuliana P. Radu:
Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures. IRPS 2020: 1-6

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