"Characterization and physical modeling of the temporal evolution of ..."

Tibor Grasser et al. (2018)

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DOI: 10.1109/IRPS.2018.8353540

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  - conf/irps/GrasserSWRRSPPR18
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Tibor Grasser, Bernhard Stampfer, Michael Waltl, Gerhard Rzepa, Karl Rupp, Franz Schanovsky, Gregor Pobegen, Katja Puschkarsky, Hans Reisinger, Barry J. O'Sullivan, Ben Kaczer:
Characterization and physical modeling of the temporal evolution of near-interfacial states resulting from NBTI/PBTI stress in nMOS/pMOS transistors. IRPS 2018: 2

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