"BTI Arbitrary Stress Patterns Characterization & Machine-Learning ..."

Louis Gerrer et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405145

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-20

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  dblp key:
  - conf/irps/GerrerCGGFCRV21
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  - https://dblp.org/rec/conf/irps/GerrerCGGFCRV21
Louis Gerrer, Jacques Cluzel, Fred Gaillard, Xavier Garros, Xavier Federspiel, Florian Cacho, David Roy, E. Vincent:
BTI Arbitrary Stress Patterns Characterization & Machine-Learning optimized CET Maps Simulations. IRPS 2021: 1-5

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