"SRAM stability design comprehending 14nm FinFET reliability."

Choelhwyi Bae et al. (2015)

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DOI: 10.1109/IRPS.2015.7112815

access: closed

type: Conference or Workshop Paper

metadata version: 2024-03-04

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Choelhwyi Bae, Sangwoo Pae, Cheong-sik Yu, Kangjung Kim, Yongshik Kim, Jongwoo Park:
SRAM stability design comprehending 14nm FinFET reliability. IRPS 2015: 13

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