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Cheong-sik Yu

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Conference and Workshop Papers

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2015
[c2]
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Soonyoung Lee, Ilgon Kim, Sungmock Ha, Cheong-sik Yu, Jinhyun Noh, Sangwoo Pae, Jongwoo Park:
Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices. IRPS 2015: 4
[c1]
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Choelhwyi Bae, Sangwoo Pae, Cheong-sik Yu, Kangjung Kim, Yongshik Kim, Jongwoo Park:
SRAM stability design comprehending 14nm FinFET reliability. IRPS 2015: 13

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