"Exploiting Parametric Power Supply and/or Temperature Variations to ..."

Jorge Semião et al. (2008)

> Home

Details and statistics

DOI: 10.1109/IOLTS.2008.51

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/iolts/SemiaoFRVSTT08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iolts/SemiaoFRVSTT08
Jorge Semião, Judit Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits. IOLTS 2008: 227-232

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.