"A methodology for measuring transistor ageing effects towards accurate ..."

Elie Maricau, Georges G. E. Gielen (2009)

> Home

Details and statistics

DOI: 10.1109/IOLTS.2009.5195978

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/iolts/MaricauG09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iolts/MaricauG09
Elie Maricau, Georges G. E. Gielen:
A methodology for measuring transistor ageing effects towards accurate reliability simulation. IOLTS 2009: 21-26

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.