"Bit-Serial Test Pattern Generation by an Accumulator Behaving as a ..."

Giorgos Dimitrakopoulos, Dimitris Nikolos, Dimitris Bakalis (2002)

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DOI: 10.1109/OLT.2002.1030199

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Giorgos Dimitrakopoulos, Dimitris Nikolos, Dimitris Bakalis:
Bit-Serial Test Pattern Generation by an Accumulator Behaving as a Non-Linear Feedback Shift Register. IOLTW 2002: 152-157

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