"The Influence of Input and Output Measurement Noise on Batch-End Quality ..."

Jef Vanlaer et al. (2012)

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DOI: 10.1007/978-3-642-31488-9_11

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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Jef Vanlaer, Pieter Van den Kerkhof, Geert Gins, Jan F. M. Van Impe:
The Influence of Input and Output Measurement Noise on Batch-End Quality Prediction with Partial Least Squares. ICDM 2012: 121-135

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