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2010 – 2019
- 2018
[j6]Jan F. M. Van Impe, Klaas Augustinus, Michiel De Prins
, Geert Gins:
Advance warning for loss of separation in an industrial distillation column. Qual. Reliab. Eng. Int. 34(1): 116-135 (2018)- 2016
- [j5]Geert Gins:
Editorial. Trans. Mach. Learn. Data Min. 9(2): 46-47 (2016) - [c6]Geert Gins, Sam Wuyts, Sander Van den Zegel, Jan F. M. Van Impe:
Extending Process Monitoring to Simultaneous False Alarm Rejection and Fault Identification (FARFI). ICDM 2016: 334-348 - 2014
- [j4]Geert Gins, Jef Vanlaer, Pieter Van den Kerkhof, Jan F. M. Van Impe:
The RAYMOND simulation package - Generating RAYpresentative MONitoring Data to design advanced process monitoring and control algorithms. Comput. Chem. Eng. 69: 108-118 (2014) - 2013
- [j3]Jef Vanlaer, Geert Gins, Jan F. M. Van Impe:
Quality assessment of a variance estimator for Partial Least Squares prediction of batch-end quality. Comput. Chem. Eng. 52: 230-239 (2013) - [c5]Pieter Van den Kerkhof, Jef Vanlaer, Geert Gins, Jan F. M. Van Impe:
Contribution plots for Statistical Process Control: Analysis of the smearing-out effect. ECC 2013: 428-433 - [c4]Geert Gins, Jef Vanlaer, Pieter Van den Kerkhof, Jan F. M. Van Impe:
Extending Statistical Models for Batch-End Quality Prediction to Batch Control. ICDM 2013: 40-54 - 2012
- [j2]Pieter Van den Kerkhof, Geert Gins, Jef Vanlaer, Jan F. M. Van Impe:
Dynamic model-based fault diagnosis for (bio)chemical batch processes. Comput. Chem. Eng. 40: 12-21 (2012) - [c3]Jef Vanlaer, Pieter Van den Kerkhof, Geert Gins, Jan F. M. Van Impe:
The Influence of Input and Output Measurement Noise on Batch-End Quality Prediction with Partial Least Squares. ICDM 2012: 121-135 - 2011
- [c2]Geert Gins, Bert Pluymers, Ilse Y. Smets, Jairo Jose Espinosa, Jan F. M. Van Impe:
Prediction of Batch-End Quality for an Industrial Polymerization Process. ICDM 2011: 314-328
2000 – 2009
- 2008
- [j1]Geert Gins, Ilse Y. Smets, Jan F. M. Van Impe:
Efficient Tracking of the Dominant Eigenspace of a Normalized Kernel Matrix. Neural Comput. 20(2): 523-554 (2008) - 2006
- [c1]Geert Gins, Jairo Jose Espinosa, Ilse Y. Smets, Wim Van Brempt, Jan F. M. Van Impe:
Data Alignment Via Dynamic Time Warping as a Prerequisite for Batch-End Quality Prediction. ICDM 2006: 506-510
Coauthor Index
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