"Two-level soft error vulnerability prediction on SMT/CMP architectures."

Lide Duan, Lu Peng, Bin Li (2011)

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DOI: 10.1109/IISWC.2011.6114203

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Lide Duan, Lu Peng, Bin Li:
Two-level soft error vulnerability prediction on SMT/CMP architectures. IISWC 2011: 78

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