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ORCIDBin Li 0008
Person information
- affiliation: Louisiana State University, Department of Experimental Statistics, Baton Rouge, LA, USA
- affiliation (PhD 2006): Ohio State University, Department of Statistics Columbus, OH, USA
Other persons with the same name
- Bin Li — disambiguation page
- Bin Li 0001 — Chinese Academy of Sciences, Shenyang Institute of Automation, State Key Laboratory of Robotics, China
- Bin Li 0002
![[0000-0002-1998-819X]](https://dblp.uni-trier.de./img/orcid-mark.12x12.png "0000-0002-1998-819X")
— Beijing University of Posts and Telecommunications, School of Information and Communication Engineering, China - Bin Li 0003 — City University of Hong Kong, Department of Linguistics and Translation, Hong Kong (and 1 more)
- Bin Li 0004 — Northeast Electric Power University, School of Information Engineering, Jilin, China (and 1 more)
- Bin Li 0005 — Sichuan University, School of Electrical Engineering and Information, Chengdu, China (and 2 more)
- Bin Li 0006 — Yangzhou University, School of Information Engineering, China (and 2 more)
- Bin Li 0007 — South China University of Technology, School of Microelectronics, Guangzhou, China (and 1 more)
- Bin Li 0009 — Tianjin University of Technology, School of Mechanical Engineering, Tianjin Key Laboratory for Advanced Mechatronic System Design and Intelligent Control, Tianjin, China
- Bin Li 0010 — Nanjing University of Information Science and Technology, School of Computer and Software, China (and 3 more)
- Bin Li 0011 — Shenzhen University, College of Information Engineering, Guangdong Key Laboratory of Intelligent Information Processing, Shenzhen Key Laboratory of Media Security, Shenzhen, China (and 2 more)
- Bin Li 0012 — Microsoft Research Asia, Beijing, China (and 1 more)
- Bin Li 0013 — Huawei Technologies, Communications Technology Research Laboratory, Shenzhen, China (and 4 more)
- Bin Li 0014 — Pennsylvania State University, School of Electrical Engineering and Computer Science, State College, PA, USA (and 3 more)
- Bin Li 0015 — Fudan University, School of Computer Science, Shanghai, China (and 3 more)
- Bin Li 0016 — Chinese Academy of Sciences, Institute of Remote Sensing and Digital Earth, Beijing, China
- Bin Li 0017 — Northwestern Polytechnical University, Department of Communication Engineering, Xi'an, China (and 1 more)
- Bin Li 0018 — Intel Labs, Hillsboro, OR, USA (and 1 more)
- Bin Li 0019 — Shanghai University, School of Mechanical and Electrical Engineering and Automation, China
- Bin Li 0020 — University of Maryland, College Park, MD, USA
- Bin Li 0021 — University of Surrey, Guildford, UK
- Bin Li 0022 — Nanjing University of Posts and Telecommunications, School of Telecommunications and Information Engineering, Nanjing, China (and 1 more)
- Bin Li 0023 — PLA Information Engineering University, State Key Laboratory of Mathematical Engineering and Advanced Computing, Zhengzhou, China
- Bin Li 0024 — South China University of Technology, School of Automation Science and Engineering, Guangzhou, China
- Bin Li 0025 — University of Science and Technology of China, School of Information Science and Technology, Hefei, China (and 3 more)
- Bin Li 0026 — Huazhong University of Science and Technology, State Key Laboratory of Digital Manufacturing Equipment and Technology, Wuhan, China (and 1 more)
- Bin Li 0027 — Wuhan University, Economics and Management School, Wuhan, China (and 1 more)
- Bin Li 0028 — Tianjin University, School of Electrical Engineering and Automation, MoE Key Laboratory of Smart Grid, China
- Bin Li 0029 — University of Waterloo, Department of Statistics and Actuarial Science, ON, Canada (and 1 more)
- Bin Li 0030 — National University of Defense Technology, College of Computer, Science and Technology on Parallel and Distributed Processing Laboratory, Changsha, China
- Bin Li 0031 — North China Electric Power University, School of Electrical and Electronic Engineering, Beijing, China (and 1 more)
- Bin Li 0032 — Tianjin University, School of Electrical and Information Engineering, China
- Bin Li 0033 — University of Hong Kong, Department of Electrical and Electronic Engineering, Hong Kong
- Bin Li 0034 — Fujian University of Technology, School of Mechanical & Automotive Engineering, Fuzhou, China (and 2 more)
- Bin Li 0035 — University of Electronic Science and Technology of China, Chengdu, China
- Bin Li 0036 — China Motion Telecom, China (and 1 more)
- Bin Li 0037 — Beijing Institute of Technology, School of Aerospace Engineering, Beijing Key Laboratory of UAV Autonomous Control, Beijing, China
- Bin Li 0038 — Alibaba Group, Hangzhou, China (and 1 more)
- Bin Li 0039 — University of Arkansas, College of Engineering, Fayetteville, AR, USA
- Bin Li 0040 — Zhengzhou University, College of Water Conservancy and Environmental Engineering, China
- Bin Li 0041 — Hunan City University, College of Mechanic and Electrical Engineering, Yiyang, China
- Bin Li 0042 — Qilu University of Technology (Shandong Academy of Sciences), School of Mathematics and Statistics, Jinan, China (and 4 more)
- Bin Li 0043 — Guangxi University, Guangxi Key Laboratory of Power System Optimization and Energy Technology, Nanning, China
- Bin Li 0044 — Xiangtan University, School of Information Engineering, MoE Key Laboratory of Intelligent Computing and Information Processing, China
- Bin Li 0045 — Beijing Research Center of Intelligent Equipment for Agriculture, Beijing, China (and 2 more)
- Bin Li 0046 — Shanxi Key Laboratory of Integrated and Intelligent Navigation, Xi'an, China (and 1 more)
- Bin Li 0047 — Sun Yat-sen University Cancer Center, State Key Laboratory of Oncology in South China, Guangzhou, China (and 2 more)
- Bin Li 0048 — Beijing Institute of Technology, Beijing Key Laboratory of Millimeter Wave and Terahertz Technology, China (and 1 more)
- Bin Li 0050 — Southern Medical University, School of Biomedical Engineering, Department of Mathematical Physics, Guangzhou, China
- Bin Li 0051 — Northwest University, School of Information Science and Technology, Xi'an, China (and 1 more)
- Bin Li 0052 — Nanjing Normal University, School of Chinese Language and Literature, Nanjing, China (and 2 more)
- Bin Li 0053 — Beijing Academy of Sciences and Technology, Beijing Institute of New Technology Applications, Beijing, China (and 2 more)
- Bin Li 0054 — Nanjing University, Department of Computer Science and Technology, State Key Laboratory for Novel Software Technology, Nanjing, China
- Bin Li 0055 — Hebei University of Technology, School of Mechanical Engineering, Tianjin, China
- Bin Li 0056 — Shantou Institute of Ultrasonic Instruments Co., Ltd., Shantou, China
- Bin Li 0057 — University of Shanghai for Science and Technology, School of Optical Electrical and Computer Engineering, Shanghai, China
- Bin Li 0058 — Chang'an University, School of Automobile, Xi'an, China
- Bin Li 0059 — Anhui University of Science and Technology, School of Safety Science and Engineering, Huainan, China
- Bin Li 0060 — Sun Yat-sen University, State Key Laboratory for Biocontrol, Key Laboratory of Gene Engineering, Guangzhou, China
- Bin Li 0061 — Central Michigan University, Department of Geography, Mount Pleasant, MI, USA
- Bin Li 0062 — China Academy of Space Technology, Xi'an, China
- Bin Li 0063 — University of Houston, Bauer College of Business, Houston, TX, USA
- Bin Li 0064 — University of Wisconsin-Madison, Department of Biomedical Engineering, Laboratory for Optical and Computational Instrumentation, Madison, WI, USA
- Bin Li 0065 — Northwestern Polytechnical University, School of Marine Science and Technology, Xi'an, China
- Bin Li 0066 — Northeastern University, College of Information Science and Engineering, State Key Laboratory of Synthetical Automation for Process Industries, Shenyang, China
- Bin Li 0068 — Communication University of China, School of Information and Communication Engineering, Beijing, China
- Bin Li 0069 — Sun Yat-sen University, School of Chemical Engineering and Technology, Zhuhai, China
- Bin Li 0070 — Anhui Open University, School of Information Engineering, Hefei, China
- Bin Li 0071 — Wuhan University, School of Geodesy and Geomatics, Wuhan, China
- Bin Li 0072 — University of Alberta, Department of Biological Sciences, Edmonton, Canada
- Bin Li 0073 — South China University of Technology, School of Software Engineering, Guangzhou, China
- Bin Li 0074 — Southeast University, School of Mathematics, Nanjing, China (and 2 more)
- Bin Li 0075 — Hunan Institute of Science and Technology, School of Information Science and Engineering, Hunan Engineering Technology Research Center for 3D Reconstruction and Intelligent Application, Yueyang, China
- Bin Li 0076 — Central South University, School of Mathematics and Statistics, Changsha, China (and 1 more)
- Bin Li 0077 — Zhejiang University, College of Mechanical Engineering, Key Laboratory of 3D Printing Process and Equipment of Zhejiang Province / State Key Laboratory of Fluid Power and Mechatronic Systems, Hangzhou, China
- Bin Li 0078 — University of Science and Technology Beijing, Institute of Artificial Intelligence, School of Automation and Electrical Engineering, Beijing, China
- Bin Li 0079 — University of Science and Technology Beijing, National Center for Materials Service Safety, Beijing, China
- Bin Li 0080 — Beihang University, School of Automation Science and Electrical Engineering, Beijing, China
- Bin Li 0081 — Liaoning Technical University, Faulty of Electrical and Control Engineering, Huludao, China
- Bin Li 0082 — Chinese University of Hong Kong, T stone Robotics Institute, Department of Mechanical and Automation Engineering, Hong Kong
- Bin Li 0083 — Hunan University, College of Electrical and Information Engineering, Changsha, China
- Bin Li 0084 — Tianjin AiForward Science and Technology Co., Ltd., China (and 2 more)
- Bin Li 0085 — Southeast University, School of Economics and Management, Nanjing, China
- Bin Li 0086 — ?
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2020 – today
- 2024
[i1]Shubhadip Dasgupta, Satwik Pate, Divya Rathore, L. G. Divyanth, Ayan Das, Anshuman Nayak, Subhadip Dey, Asim Biswas, David C. Weindorf, Bin Li, Sérgio Henrique Godinho Silva, Bruno Teixeira Ribeiro, Sanjay Srivastava, Somsubhra Chakraborty:
Soil Fertility Prediction Using Combined USB-microscope Based Soil Image, Auxiliary Variables, and Portable X-Ray Fluorescence Spectrometry. CoRR abs/2404.12415 (2024)- 2023
- [j20]Veerabhadrappa Lavanya, Anshuman Nayak, Partha Deb Roy, Shubhadip Dasgupta, Subhadip Dey, Bin Li, David C. Weindorf, Somsubhra Chakraborty:
A Smartphone-Enabled Imaging Device for Chromotropic Acid-Based Measurement of Nitrate in Soil Samples. Sensors 23(17): 7345 (2023) - 2022
- [j19]R. K. Swetha, Subhadip Dasgupta, Somsubhra Chakraborty, Bin Li, David C. Weindorf, Marcelo Mancini, Sérgio Henrique Godinho Silva, Bruno Teixeira Ribeiro, Nilton Curi, Deb Prasad Ray:
Using Nix color sensor and Munsell soil color variables to classify contrasting soil types and predict soil organic carbon in Eastern India. Comput. Electron. Agric. 199: 107192 (2022) - [j18]Bin Li, Qingzhao Yu, Lu Peng:
Ensemble of fast learning stochastic gradient boosting. Commun. Stat. Simul. Comput. 51(1): 40-52 (2022) - 2021
- [j17]Bin Li, Somsubhra Chakraborty, David C. Weindorf, Qingzhao Yu:
Data Integration Using Model-Based Boosting. SN Comput. Sci. 2(5): 400 (2021) - 2020
- [j16]Srikanth Gorthi, Somsubhra Chakraborty, Bin Li, David C. Weindorf:
A field-portable acoustic sensing device to measure soil moisture. Comput. Electron. Agric. 174: 105517 (2020) - [j15]Samuel Irving, Bin Li, Shaoming Chen, Lu Peng, Weihua Zhang, Lide Duan:
Computer comparisons in the presence of performance variation. Frontiers Comput. Sci. 14(1): 21-41 (2020) - [j14]Yaping Xu, Lei Wang, Ziqiang Ma, Bin Li, Rudy Bartels, Cuiling Liu, Xukai Zhang, Jianzhi Dong:
Spatially Explicit Model for Statistical Downscaling of Satellite Passive Microwave Soil Moisture. IEEE Trans. Geosci. Remote. Sens. 58(2): 1182-1191 (2020)
2010 – 2019
- 2017
- [j13]Bin Li, Qingzhao Yu:
A nonparametric test of independence between 2 variables. Stat. Anal. Data Min. 10(6): 422-435 (2017) - 2016
- [j12]Sui Chen, Greg Bronevetsky, Lu Peng, Bin Li, Xin Fu:
Soft error resilience in Big Data kernels through modular analysis. J. Supercomput. 72(4): 1570-1596 (2016) - 2015
- [j11]Ying Zhang, Lide Duan, Bin Li, Lu Peng, Sadagopan Srinivasan:
Cross-architecture prediction based scheduling for energy efficient execution on single-ISA heterogeneous chip-multiprocessors. Microprocess. Microsystems 39(4-5): 271-285 (2015) - [j10]Shaoming Chen, Lu Peng, Yue Hu, Zhou Zhao, Ashok Srivastava, Ying Zhang, Jin-Woo Choi, Bin Li, Edward Song:
Powering Up Dark Silicon: Mitigating the Limitation of Power Delivery via Dynamic Pin Switching. IEEE Trans. Emerg. Top. Comput. 3(4): 489-501 (2015) - [j9]Sui Chen, Greg Bronevetsky, Bin Li, Marc Casas-Guix, Lu Peng:
A framework for evaluating comprehensive fault resilience mechanisms in numerical programs. J. Supercomput. 71(8): 2963-2984 (2015) - [c12]Bin Li, Shaoming Chen, Lu Peng:
Precise computer comparisons via statistical resampling methods. ISPASS 2015: 83-92 - 2014
- [j8]Ying Zhang, Lide Duan, Bin Li, Lu Peng, Xin Fu:
Design configuration selection for hard-error reliable processors via statistical rules. Microprocess. Microsystems 38(1): 22-30 (2014) - [j7]Lide Duan, Ying Zhang, Bin Li, Lu Peng:
Comprehensive and Efficient Design Parameter Selection for Soft Error Resilient Processors via Universal Rules. IEEE Trans. Computers 63(9): 2201-2214 (2014) - [c11]Ying Zhang, Lide Duan, Bin Li, Lu Peng, Sadagopan Srinivasan:
Energy efficient job scheduling in single-ISA heterogeneous chip-multiprocessors. ISQED 2014: 660-666 - 2013
- [j6]Lide Duan, Lu Peng, Bin Li:
Predicting Architectural Vulnerability on Multithreaded Processors under Resource Contention and Sharing. IEEE Trans. Dependable Secur. Comput. 10(2): 114-127 (2013) - 2012
- [j5]Qingzhao Yu, Bin Li, Zhide Fang, Lu Peng:
Model guided adaptive design and analysis in computer experiment. Stat. Anal. Data Min. 5(5): 399-409 (2012) - [c10]Ying Zhang, Lide Duan, Bin Li, Lu Peng:
Optimal microarchitectural design configuration selection for processor hard-error reliability. ISQED 2012: 91-96 - 2011
- [c9]Jianmin Chen, Bin Li, Ying Zhang, Lu Peng, Jih-Kwon Peir:
Statistical GPU power analysis using tree-based methods. IGCC 2011: 1-6 - [c8]Jianmin Chen, Bin Li, Ying Zhang, Lu Peng, Jih-Kwon Peir:
Tree structured analysis on GPU power study. ICCD 2011: 57-64 - [c7]Lide Duan, Lu Peng, Bin Li:
Two-level soft error vulnerability prediction on SMT/CMP architectures. IISWC 2011: 78 - [c6]Ying Zhang, Lu Peng, Bin Li, Jih-Kwon Peir, Jianmin Chen:
Architecture comparisons between Nvidia and ATI GPUs: Computation parallelism and data communications. IISWC 2011: 205-215 - [c5]Lide Duan, Ying Zhang, Bin Li, Lu Peng:
Universal rules guided design parameter selection for soft error resilient processors. ISPASS 2011: 247-256 - [c4]Ying Zhang, Yue Hu, Bin Li, Lu Peng:
Performance and Power Analysis of ATI GPU: A Statistical Approach. NAS 2011: 149-158 - 2010
- [j4]Ran Tao, Li Yang, Lu Peng, Bin Li:
A Host-Based Intrusion Detection System Using Architectural Features to Improve Sophisticated Denial-of-Service Attack Detections. Int. J. Inf. Secur. Priv. 4(1): 18-31 (2010) - [j3]Bin Li, Lide Duan, Lu Peng:
Efficient Microarchitectural Vulnerabilities Prediction Using Boosted Regression Trees and Patient Rule Inductions. IEEE Trans. Computers 59(5): 593-607 (2010)
2000 – 2009
- 2009
- [j2]Bin Li, Lu Peng, Balachandran Ramadass:
Accurate and efficient processor performance prediction via regression tree based modeling. J. Syst. Archit. 55(10-12): 457-467 (2009) - [c3]Ran Tao, Li Yang, Lu Peng, Bin Li, Alma Cemerlic:
A case study: Using architectural features to improve sophisticated denial-of-service attack detections. CICS 2009: 13-18 - [c2]Lide Duan, Bin Li, Lu Peng:
Versatile prediction and fast estimation of Architectural Vulnerability Factor from processor performance metrics. HPCA 2009: 129-140 - 2008
- [j1]Bin Li, Qingzhao Yu:
Classification of functional data: A segmentation approach. Comput. Stat. Data Anal. 52(10): 4790-4800 (2008) - [c1]Bin Li, Lu Peng, Balachandran Ramadass:
Efficient mart-aided modeling for microarchitecture design space exploration and performance prediction. SIGMETRICS 2008: 439-440
Coauthor Index
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