"A non-intrusive method for measuring switching losses of GaN power ..."

Julio Brandelero et al. (2013)

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DOI: 10.1109/IECON.2013.6699143

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Julio Brandelero, Bernardo Cougo, Thierry Meynard, Nicolas Videau:
A non-intrusive method for measuring switching losses of GaN power transistors. IECON 2013: 246-251

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