"Reliability analysis of CMOS inverter subjected to AC & DC NBTI stresses."

Amel Chenouf et al. (2014)

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DOI: 10.1109/IDT.2014.7038602

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Amel Chenouf, Boualem Djezzar, Abdelmadjid Benabdelmoumene, Hakim Tahi, Mohamed Goudjil:
Reliability analysis of CMOS inverter subjected to AC & DC NBTI stresses. IDT 2014: 142-146

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