"Reaction-diffusion model for interface traps induced by BTS stress ..."

Mohamed Boubaaya et al. (2014)

> Home

Details and statistics

DOI: 10.1109/IDT.2014.7038619

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/idt/BoubaayaTDBBGDH14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/idt/BoubaayaTDBBGDH14
Mohamed Boubaaya, Hakim Tahi, Boualem Djezzar, Karim Benmassai, Abdelmadjid Benabdelmoumene, Mohamed Goudjil, Djamila Doumaz, Abdelhak Feraht Hemida:
Reaction-diffusion model for interface traps induced by BTS stress including H⁺, H and H2 as diffusion species. IDT 2014: 231-235

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.