"CrackNex: a Few-shot Low-light Crack Segmentation Model Based on Retinex ..."

Zhen Yao et al. (2024)

> Home

Details and statistics

DOI: 10.1109/ICRA57147.2024.10611660

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icra/Yao0HC24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icra/Yao0HC24
Zhen Yao, Jiawei Xu, Shuhang Hou, Mooi Choo Chuah:
CrackNex: a Few-shot Low-light Crack Segmentation Model Based on Retinex Theory for UAV Inspections. ICRA 2024: 11155-11162

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.