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"Robustness study of 1700 V 45 mΩ SiC MOSFETs."
Quentin Molin et al. (2018)
- Quentin Molin, Mehdi Kanoun, Christophe Raynaud, Hervé Morel:
Robustness study of 1700 V 45 mΩ SiC MOSFETs. ICIT 2018: 830-834
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