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Mehdi Kanoun

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2010 – 2019

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2018
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Quentin Molin, Mehdi Kanoun, Christophe Raynaud, Hervé Morel:
Measurement and analysis of SiC-MOSFET threshold voltage shift. Microelectron. Reliab. 88-90: 656-660 (2018)
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Quentin Molin, Mehdi Kanoun, Christophe Raynaud, Hervé Morel:
Robustness study of 1700 V 45 mΩ SiC MOSFETs. ICIT 2018: 830-834

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