"A mixed LPDDR2 impedance calibration technique exploiting 28nm ..."

Dimitri Soussan et al. (2012)

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DOI: 10.1109/ICICDT.2012.6232877

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Dimitri Soussan, Alexandre Valentian, Sylvain Majcherczak, Marc Belleville:
A mixed LPDDR2 impedance calibration technique exploiting 28nm Fully-Depleted SOI Back-Biasing. ICICDT 2012: 1-4

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