"Layout dependent BTI and HCI degradation in nano CMOS technology: A new ..."

Pengpeng Ren, Runsheng Wang, Ru Huang (2016)

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DOI: 10.1109/ICICDT.2016.7542063

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-03

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Pengpeng Ren, Runsheng Wang, Ru Huang:
Layout dependent BTI and HCI degradation in nano CMOS technology: A new time-dependent LDE and impacts on circuit at end of life. ICICDT 2016: 1-3

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