"Energy efficiency deterioration by variability in SRAM and circuit ..."

Atsushi Kawasumi et al. (2012)

> Home

Details and statistics

DOI: 10.1109/ICICDT.2012.6232859

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icicdt/KawasumiTHKTNSY12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icicdt/KawasumiTHKTNSY12
Atsushi Kawasumi, Yasuhisa Takeyama, Osamu Hirabayashi, Keiichi Kushida, Fumihiko Tachibana, Yusuke Niki, Shinichi Sasaki, Tomoaki Yabe:
Energy efficiency deterioration by variability in SRAM and circuit techniques for energy saving without voltage reduction. ICICDT 2012: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.