"Comparing defect coverage for current-mode logic and CMOS VLSI cells."

Côme Rozon et al. (2000)

> Home

Details and statistics

DOI: 10.1109/ICECS.2000.911572

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/icecsys/RozonAAR00
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icecsys/RozonAAR00
Côme Rozon, Dhamin Al-Khalili, Saman Adham, Douglas Racz:
Comparing defect coverage for current-mode logic and CMOS VLSI cells. ICECS 2000: 429-432

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.