"Offset measurement method for accurate characterization of BTI-induced ..."

Swaraj Mahato et al. (2012)

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DOI: 10.1109/ICECS.2012.6463639

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Swaraj Mahato, Pieter De Wit, Elie Maricau, Georges G. E. Gielen:
Offset measurement method for accurate characterization of BTI-induced degradation in opamps. ICECS 2012: 661-664

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