"Numerical simulation and modeling of static characteristics and electrical ..."

M. Fadlallah et al. (2000)

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DOI: 10.1109/ICECS.2000.913031

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-20

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M. Fadlallah, Gérard Ghibaudo, Jalal Jomaah, M. Zoaeter:
Numerical simulation and modeling of static characteristics and electrical noise in submicron MOS transistors. ICECS 2000: 940-943

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