"Bulk and FDSOI Sub-micron CMOS transistors resilience to single-event ..."

Walter E. Calienes Bartra, Andrei Vladimirescu, Ricardo Reis (2015)

Details and statistics

DOI: 10.1109/ICECS.2015.7440267

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06