"Concurrent Core Test for Test Cost Reduction Using Merged Test Set and ..."

Gang Zeng, Hideo Ito (2005)

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DOI: 10.1109/ICCD.2005.39

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Gang Zeng, Hideo Ito:
Concurrent Core Test for Test Cost Reduction Using Merged Test Set and Scan Tree. ICCD 2005: 143-146

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