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"Simulation-based functional test justification using a ..."

Charles H.-P. Wen, Onur Guzey, Li-C. Wang (2006)

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DOI: 10.1109/ICCD.2006.4380832

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Charles H.-P. Wen, Onur Guzey, Li-C. Wang:
Simulation-based functional test justification using a decision-digram-based Boolean data miner. ICCD 2006: 300-307

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