"Functional Fmax test-time reduction using novel DFTs for circuit ..."

Ujjwal Guin, Tapan J. Chakraborty, Mohammad Tehranipoor (2013)

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DOI: 10.1109/ICCD.2013.6657017

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ujjwal Guin, Tapan J. Chakraborty, Mohammad Tehranipoor:
Functional Fmax test-time reduction using novel DFTs for circuit initialization. ICCD 2013: 1-6

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