"Chip clustering with mutual information on multiple clock tests and its ..."

Jiun-Yi Chiang et al. (2014)

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DOI: 10.1109/ICCD.2014.6974688

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Jiun-Yi Chiang, Jun-Hua Kuo, Ting-Shuo Hsu, Jing-Jia Liou:
Chip clustering with mutual information on multiple clock tests and its application to yield tuning. ICCD 2014: 243-248

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