"An optimal probe testing algorithm for the connectivity verification of ..."

So-Zen Yao et al. (1992)

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DOI: 10.1109/ICCAD.1992.279363

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/iccad/YaoCCH92
So-Zen Yao, Nan-Chi Chou, Chung-Kuan Cheng, T. C. Hu:
An optimal probe testing algorithm for the connectivity verification of MCM substrates. ICCAD 1992: 264-267

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