"A thermal and process variation aware MTJ switching model and its ..."

Peiyuan Wang et al. (2012)

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DOI: 10.1145/2429384.2429541

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

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Peiyuan Wang, Wei Zhang, Rajiv V. Joshi, Rouwaida Kanj, Yiran Chen:
A thermal and process variation aware MTJ switching model and its applications in soft error analysis. ICCAD 2012: 720-727

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