"Leveraging recovery effect to reduce electromigration degradation in ..."

Shengcheng Wang et al. (2017)

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DOI: 10.1109/ICCAD.2017.8203861

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-19

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Shengcheng Wang, Zeyu Sun, Yuan Cheng, Sheldon X.-D. Tan, Mehdi Baradaran Tahoori:
Leveraging recovery effect to reduce electromigration degradation in power/ground TSV. ICCAD 2017: 811-818

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