"Fault-based automatic test generator for linear analog circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Naveena Nagi et al. (1993)

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DOI: 10.1109/ICCAD.1993.580036

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Naveena Nagi, Abhijit Chatterjee, Ashok Balivada, Jacob A. Abraham:
Fault-based automatic test generator for linear analog circuits. ICCAD 1993: 88-91

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