"Dynamic reliability management for near-threshold dark silicon processors."

Taeyoung Kim et al. (2016)

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DOI: 10.1145/2966986.2980080

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-19

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Taeyoung Kim, Zeyu Sun, Chase Cook, Jagadeesh Gaddipati, Hai Wang, Hai-Bao Chen, Sheldon X.-D. Tan:
Dynamic reliability management for near-threshold dark silicon processors. ICCAD 2016: 70

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