"Statistical modeling of metal-gate work-function variability in emerging ..."

Hamed F. Dadgour, Vivek De, Kaustav Banerjee (2008)

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DOI: 10.1109/ICCAD.2008.4681585

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hamed F. Dadgour, Vivek De, Kaustav Banerjee:
Statistical modeling of metal-gate work-function variability in emerging device technologies and implications for circuit design. ICCAD 2008: 270-277

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