"A statistical approach for full-chip gate-oxide reliability analysis."

Kaviraj Chopra et al. (2008)

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DOI: 10.1109/ICCAD.2008.4681653

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kaviraj Chopra, Cheng Zhuo, David T. Blaauw, Dennis Sylvester:
A statistical approach for full-chip gate-oxide reliability analysis. ICCAD 2008: 698-705

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