"A Novel Semi-Analytical Approach for Fast Electromigration Stress Analysis ..."

Olympia Axelou et al. (2022)

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DOI: 10.1145/3508352.3549476

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Olympia Axelou, Nestor E. Evmorfopoulos, George Floros, George I. Stamoulis, Sachin S. Sapatnekar:
A Novel Semi-Analytical Approach for Fast Electromigration Stress Analysis in Multi-Segment Interconnects. ICCAD 2022: 27:1-27:7

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