"Automated test generation for post silicon microcontroller validation."

Pankaj Moharikar, Jayakrishna Guddeti (2017)

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DOI: 10.1109/HLDVT.2017.8167462

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Pankaj Moharikar, Jayakrishna Guddeti:
Automated test generation for post silicon microcontroller validation. HLDVT 2017: 45-52

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