"Analyzing Software Quality with Limited Fault-Proneness Defect Data."

Naeem Seliya, Taghi M. Khoshgoftaar, Shi Zhong (2005)

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DOI: 10.1109/HASE.2005.4

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-21

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Naeem Seliya, Taghi M. Khoshgoftaar, Shi Zhong:
Analyzing Software Quality with Limited Fault-Proneness Defect Data. HASE 2005: 89-98

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