"2-level LFSR scheme with asynchronous test pattern transfer for low cost ..."

Seung-Moon Yoo, Seong-Ook Jung, Sung-Mo Kang (2001)

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DOI: 10.1145/368122.368874

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Seung-Moon Yoo, Seong-Ook Jung, Sung-Mo Kang:
2-level LFSR scheme with asynchronous test pattern transfer for low cost and high efficiency build-in-self-test. ACM Great Lakes Symposium on VLSI 2001: 93-96

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