"Efficient Reliability Analysis of Processor Datapath using Atomistic BTI ..."

Dimitrios Stamoulis et al. (2015)

> Home

Details and statistics

DOI: 10.1145/2742060.2742079

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/glvlsi/StamoulisRMSCZ15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/glvlsi/StamoulisRMSCZ15
Dimitrios Stamoulis, Dimitrios Rodopoulos, Brett H. Meyer, Dimitrios Soudris, Francky Catthoor, Zeljko Zilic:
Efficient Reliability Analysis of Processor Datapath using Atomistic BTI Variability Models. ACM Great Lakes Symposium on VLSI 2015: 57-62

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.