"A Design-for-Testability Technique for Detecting Delay Faults in Logic ..."

Kaamran Raahemifar, Majid Ahmadi (1998)

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DOI: 10.1109/GLSV.1998.665244

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Kaamran Raahemifar, Majid Ahmadi:
A Design-for-Testability Technique for Detecting Delay Faults in Logic Circuits. Great Lakes Symposium on VLSI 1998: 249-

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