"Test Compaction for Synchronous Sequential Circuits by Test Sequence ..."

Irith Pomeranz, Sudhakar M. Reddy (1998)

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DOI: 10.1109/GLSV.1998.665229

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Irith Pomeranz, Sudhakar M. Reddy:
Test Compaction for Synchronous Sequential Circuits by Test Sequence Recycling. Great Lakes Symposium on VLSI 1998: 216-221

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