"TEM-cell and surface scan to identify the electromagnetic emission of ..."

Timm Ostermann, Bernd Deutschmann (2003)

> Home

Details and statistics

DOI: 10.1145/764808.764829

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/glvlsi/OstermannD03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/glvlsi/OstermannD03
Timm Ostermann, Bernd Deutschmann:
TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits. ACM Great Lakes Symposium on VLSI 2003: 76-79

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.