"Evaluation of the Complexity of Automated Trace Alignment using Novel ..."

Bozhi Liu et al. (2018)

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DOI: 10.1145/3194554.3194640

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type: Conference or Workshop Paper

metadata version: 2018-11-21

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Bozhi Liu, Kemeng Chen, Minjun Seo, Janet Meiling Wang, Roman Lysecky:
Evaluation of the Complexity of Automated Trace Alignment using Novel Power Obfuscation Methods. ACM Great Lakes Symposium on VLSI 2018: 467-470

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