"A novel reseeding technique for accumulator-based test pattern generation."

Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos (2001)

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DOI: 10.1145/368122.368145

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Xrysovalantis Kavousianos, Dimitris Bakalis, Dimitris Nikolos:
A novel reseeding technique for accumulator-based test pattern generation. ACM Great Lakes Symposium on VLSI 2001: 7-12

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