"Variability evaluation of feedback circuits used in nanoelectronic ..."

Arne Heittmann, Tobias G. Noll (2013)

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DOI: 10.1145/2483028.2483078

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Arne Heittmann, Tobias G. Noll:
Variability evaluation of feedback circuits used in nanoelectronic Memristive/CMOS circuits. ACM Great Lakes Symposium on VLSI 2013: 137-142

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