"A sequential circuit test generation using threshold-value simulation."

Kwang-Ting Cheng, Vishwani D. Agrawal, Ernest S. Kuh (1988)

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DOI: 10.1109/FTCS.1988.5292

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

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Kwang-Ting Cheng, Vishwani D. Agrawal, Ernest S. Kuh:
A sequential circuit test generation using threshold-value simulation. FTCS 1988: 24-29

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