"The Reliability of FPGA Circuit Designs in the Presence of Radiation ..."

Michael J. Wirthlin et al. (2003)

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DOI: 10.1109/FPGA.2003.1227249

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Michael J. Wirthlin, Darrel Eric Johnson, Nathan Rollins, Michael P. Caffrey, Paul S. Graham:
The Reliability of FPGA Circuit Designs in the Presence of Radiation Induced Configuration Upsets. FCCM 2003: 133-142

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