"A technique for low power, stuck-at fault diagnosable and reconfigurable ..."

Binod Kumar et al. (2016)

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DOI: 10.1109/EWDTS.2016.7807675

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/ewdts/KumarNPST16
Binod Kumar, Boda Nehru, Brajesh Pandey, Virendra Singh, Jaynarayan T. Tudu:
A technique for low power, stuck-at fault diagnosable and reconfigurable scan architecture. EWDTS 2016: 1-4

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